Evaluation of paracrystalline lattice distortion by profile analysis using a single X-ray diffraction peak

International Journal of Pharmaceutics

Volumn 133, Issue 1-2, 1996, Pages 117-125

  Yamamura, Shigeo ^a   Momose, Yasunori ^a   Terada, Katsuhide ^b   Fukuoka, Eihei ^a  

^a TOHO UNIVERSITY   (Japan)

^b CHUGAI PHARMACEUTICAL CO LTD   (Japan)

Author keywords

Crystallite; Grinding; Lattice distortion; Paracrystal; Peak profile analysis; X ray powder diffraction

Indexed keywords

ACETAZOLAMIDE; GRISEOFULVIN; TOLBUTAMIDE;

ARTICLE; CRYSTAL STRUCTURE; FOURIER ANALYSIS; POWDER; PRIORITY JOURNAL; TECHNIQUE; X RAY DIFFRACTION;

EID: 0029898539     PISSN: 03785173     EISSN: None     Source Type: Journal    
DOI: 10.1016/0378-5173(95)04434-5     Document Type: Article

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