Digital imaging for scanning electron microscopy

Scanning

Volumn 18, Issue 2, 1996, Pages 1-7

  Poster, Michael T ^a   Vladár, András E ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

Author keywords

analog SEM; digital image acquisition; digital SEM; image processing

Indexed keywords

ARTICLE; COMPUTER ANALYSIS; COMPUTER PROGRAM; DIGITAL FILTERING; IMAGE PROCESSING; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 0029871450     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.1996.4950180101     Document Type: Article

References (8)

1. Edax International, 85 McKee Drive. Mahwah, NJ 07430, USA
2. Egerton RF, Bright DS, Davilla SD, Ingram P, Kirkland EJ, Kundmann M, Lyman CE, Rez P, Steele E, Zaluzek NJ: Standard Formats for the Exchange and Storage of Image Data. MSA Proceedings (Eds. Bailey GW, Reider CL). (1993) 220-221
3. 4pi Analysis, Inc., 3500 Westgate Drive Suite 403, Durham, NC 27707, USA
4. Newbury DE: Compositional imaging by electron probe microanalysis: Capabilities, limitations, opportunities. Microscopy: The Key Research Tool 22, No. 1, 11-20 (1992)
5. Postek MT, Vladár, AE, Jones SN, Keery WJ: Interlaboratory study on the lithographically produced scanning electron microscope magnification standard prototype. NIST J Res 98(4), 447-467 (1993)
6. Scion Corp., 152 West Patrick Street, Frederick, MD 21701, USA
7. Signal Analytics Corp , 440 Maple Ave. East, Vienna VA 22180, USA
8. Vladár AE, Postek MT, Davilla SD: Is your scanning electron microscope hi-fi? Scanning 17, (287-295) (1995)