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Volumn 345, Issue 3, 1996, Pages 320-330
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Detecting stacking faults during epitaxial growth by low energy electron diffraction
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Author keywords
Cobalt; Copper; Diffraction; Electron solid interactions; Growth; Low energy electron diffraction (LEED); Scattering
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Indexed keywords
COBALT;
COMPUTER SIMULATION;
COPPER;
EPITAXIAL GROWTH;
LEAD;
LOW ENERGY ELECTRON DIFFRACTION;
SCATTERING;
SURFACES;
ELECTRON SOLID INTERACTIONS;
INTENSITY SPECTRA;
SURFACTANT LAYER;
STACKING FAULTS;
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EID: 0029778584
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(95)00881-0 Document Type: Article |
Times cited : (16)
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References (32)
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