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Volumn 345, Issue 3, 1996, Pages 320-330

Detecting stacking faults during epitaxial growth by low energy electron diffraction

Author keywords

Cobalt; Copper; Diffraction; Electron solid interactions; Growth; Low energy electron diffraction (LEED); Scattering

Indexed keywords

COBALT; COMPUTER SIMULATION; COPPER; EPITAXIAL GROWTH; LEAD; LOW ENERGY ELECTRON DIFFRACTION; SCATTERING; SURFACES;

EID: 0029778584     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)00881-0     Document Type: Article
Times cited : (16)

References (32)
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    • G. Meyer, J. Wollschläger and M. Hensler, Surf. Sci. 231 (1990) 64; M. Hensler, Surf. Sci. 298 (1993) 369.
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  • 23
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    • unpublished
    • G. Rangelov et al., unpublished.
    • Rangelov, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.