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Volumn 22, Issue 2, 1996, Pages 47-50
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Correlation between short- and long-term SIR testing
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CORRELATION THEORY;
FLUXES;
IMPURITIES;
NONDESTRUCTIVE EXAMINATION;
PRODUCTION CONTROL;
QUALITY CONTROL;
RELIABILITY;
SOLDERING;
STATISTICAL METHODS;
SUBLIMATION;
CRITICAL TEMPERATURE;
CURVE ANALYSIS;
ELECTROCHEMICAL MIGRATION TESTING;
IONIC CONTAMINATION TESTING;
LONG TERM QUALIFICATION TESTING;
SURFACE INSULATION RESISTANCE TESTING;
PRINTED CIRCUIT BOARDS;
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EID: 0029778005
PISSN: 03056120
EISSN: None
Source Type: Journal
DOI: 10.1108/03056129610799976 Document Type: Article |
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Times cited : (2)
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References (11)
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