Exploit analog IFA to improve specification based tests

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 542-546

  Atzema, Bert ^a   Zwemstra, Taco ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN; SPECIFICATIONS;

DESIGN FOR TESTING; INDUCTIVE FAULT ANALYSIS;

LOGIC CIRCUITS;

EID: 0029777832     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)