Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film

Journal of the Electrochemical Society

Volumn 143, Issue 1, 1996, Pages 302-305

  Dang, Tuan A ^a   Chou, Chung N ^a  

^a OSRAM SYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; COATING TECHNIQUES; HYDROGEN BONDS; OXYGEN; PRECIPITATION (CHEMICAL); SILICA; SORPTION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

COOL WHITE PHOSPHORS; ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS; HYDROGEN BONDING FORMATION; PHYSISORPTION; TETRAETHYLORTHOSILICATE;

PHOSPHORS;

EID: 0029777785     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1836427     Document Type: Article

References (12)

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