Dynamic characterization of a-Si TFT-LCD pixels

IEEE Transactions on Electron Devices

Volumn 43, Issue 1, 1996, Pages 31-39

  Aoki, Hitoshi ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CAPACITANCE; COMPUTER SIMULATION; CONVERGENCE OF NUMERICAL METHODS; CURRENT VOLTAGE CHARACTERISTICS; LEAKAGE CURRENTS; LIQUID CRYSTAL DISPLAYS; MATHEMATICAL MODELS; MATRIX ALGEBRA; PHOTOCONDUCTIVITY;

DYNAMIC ANALYSIS; EMPIRICAL EQUATIONS; FLAT PANEL DISPLAYS; THRESHOLD VOLTAGE;

THIN FILM TRANSISTORS;

EID: 0029777040     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.477590     Document Type: Article

References (13)

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