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Volumn , Issue , 1996, Pages 384-389
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Systems view of test standardization
a a
a
ARINC
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTIFICIAL INTELLIGENCE;
AUTOMATIC TESTING;
EXPERT SYSTEMS;
STANDARDIZATION;
TEST ENGINEERING;
ELECTRONIC EQUIPMENT TESTING;
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EID: 0029773145
PISSN: 07347510
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (16)
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