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Volumn 398, Issue , 1996, Pages 257-262
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Nucleation and growth of the first phase in sputter-deposited Nb/Al multilayer thin films
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ANNEALING;
DIFFERENTIAL SCANNING CALORIMETRY;
FILM GROWTH;
GRAIN BOUNDARIES;
INTERFACES (MATERIALS);
MULTILAYERS;
NIOBIUM;
NUCLEATION;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ISOTHERMAL CALORIMETRIC SCANS;
PHASE FORMATION;
PHASE TRANSITIONS;
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EID: 0029773135
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (6)
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