Growth and characterization of (Y, Pr)-123 single crystals: Influence of Al contamination and post-annealing under oxygen pressure

Physica C: Superconductivity and its Applications

Volumn 256, Issue 1-2, 1996, Pages 168-176

  Widder, W ^a   Stebani, M ^a   Bauernfeind, L ^a   Braun, H F ^a   Widder, K ^b   Geserich, H P ^b   Rubhausen M ^c   Dieckmann, N ^c   Bock, A ^d  

^a UNIVERSITY OF BAYREUTH   (Germany)

^b UNIVERSITY OF KARLSRUHE   (Germany)

^c UNIVERSITY OF HAMBURG   (Germany)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ANNEALING; CHARACTERIZATION; CONTAMINATION; CRYSTAL GROWTH; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; OXYGEN; RAMAN SPECTROSCOPY; SINGLE CRYSTALS; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

AC SUSCEPTIBILITY; ALUMINA CRUCIBLES; ALUMINUM CONTAMINATION; ENERGY DISPERSIVE XRAY SPECTROSCOPY; FREE CARRIER CONCENTRATION; OPTICAL REFLECTANCE MEASUREMENTS; OXYGEN PRESSURE; RAMAN MEASUREMENTS; SELF FLUX METHOD;

SUPERCONDUCTING MATERIALS;

EID: 0029772759     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(95)00636-2     Document Type: Article

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