1/f noise and dark current components in HgCdTe MIS infrared detectors

Solid-State Electronics

Volumn 39, Issue 1, 1996, Pages 127-132

  He, Wenmu ^a   Celik Butler, Zeynep ^a  

^a Southern Methodist University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER DEVICES; ELECTRIC CURRENT MEASUREMENT; ELECTRON TUNNELING; GATES (TRANSISTOR); MIS DEVICES; SEMICONDUCTING SILVER COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE; VOLTAGE DISTRIBUTION MEASUREMENT;

CHARGE-INTEGRATING DEVICES; DARK CURRENT MEASUREMENTS; DEPLETION DARK CURRENT; DEVICE GATE VOLTAGE; MIS INFRARED DETECTORS; SHOCKLEY-READ-HALL CENTER; SILVER CADMIUM TELLURIUM MIS DEVICES; TRAP DENSITY;

INFRARED DETECTORS;

EID: 0029772427     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(95)00089-C     Document Type: Article

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