Scanning acoustic microscopy of SCS-6 silicon carbide fiber

Journal of the American Ceramic Society

Volumn 79, Issue 1, 1996, Pages 209-212

  Sathish, Shamachary ^a   Cantrell, John H ^b   Yost, William T ^b  

^a ANALYTICAL SERVICES AND MATERIALS INC   (United States)

^b NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; ELASTIC MODULI; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; PRESSURE EFFECTS; SILICON CARBIDE; STOICHIOMETRY;

SCANNING ACOUSTIC MICROSCOPY;

CERAMIC FIBERS;

EID: 0029771715     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb07900.x     Document Type: Article

References (9)

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