Atomic force microscopy and scanning tunneling microscopy studies of AlCl3-graphite intercalation compound

Carbon

Volumn 34, Issue 2, 1996, Pages 277-279

  Ikemiya, N ^a   Shimazu, E ^a   Hara, S ^a   Shioyama, H ^b   Sawada, Y ^b  

^a OSAKA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

AlCl3 graphite intercalation compound; Atomic force microscopy; Scanning tunneling microscopy; Surface structure

Indexed keywords

ALUMINUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; ATOMS; CHLORINE COMPOUNDS; ELECTRONIC STRUCTURE; MOLECULES; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

METAL CHLORIDE; SUPERLATTICE STRUCTURE; SURFACE ELECTRONIC STRUCTURE;

INTERCALATION COMPOUNDS;

EID: 0029771234     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/0008-6223(96)83348-3     Document Type: Letter

References (9)

1. E.L. Evans and J.M. Thomas, J. Solid State Chem., 14, 99 (1975).
2. R. Levi-Setti, G. Crow, Y.L. Wang, N.W. Parker, R. Mittleman and D.M. Hwang, Phys. Rev. Lett., 54, 2615 (1985).
3. P. Biensan, J.-C. Roux, H. Saadaoui and S. Flandrois, Microsc. Microanal. Microstruct., 1, 103 (1990).
4. N. Ikemiya, S. Hara, K. Ogino and T. Nakajima, Surf. Sci., 274, L524 (1992).
5. N. Ikemiya, Y. Okazaki, S. Hara and T. Nakajima, Carbon, 32, 1191 (1994).
6. E. Stumpp, Mater. Sci. Eng., 31, 53 (1977).
7. S. Gwo and C.K. Shih, Phys. Rev, B47, 13059 (1993).
8. For example, W. Haiss, J.K. Sass, X. Gao and M.J. Weaver, Surf. Sci., 274, L593.
9. V. Maurice and P. Marcus, Surf. Sci., 275, 65 (1992).