TEM-cell based method for radiative susceptibility characterization of low-power microcontrollers

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 1996, Pages 76-81

  Engel, Andy ^a   Astrain, Hector ^a   Cagle, John ^a   Ledford, Steven ^a   Mahalingam, Mali ^a  

^a CSIC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTROMAGNETIC FIELDS; RANDOM ACCESS STORAGE;

ELECTROMAGNETIC WAVE SUSCEPTIBILITY; LOW POWER MICROCONTROLLERS; QUIESCENT CURRENT; TRANSVERSE ELECTROMAGNETIC CELL;

INTEGRATED CIRCUIT TESTING;

EID: 0029770769     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)