Fiber coupled ultrafast scanning tunneling microscope

Technical Digest - European Quantum Electronics Conference

Volumn , Issue , 1996, Pages 202-

  Keil, Ulrich D ^a   Hvam, Jorn M ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL EFFECTS; OPTICAL FIBERS; OPTICAL SWITCHES; PHOTOCONDUCTING DEVICES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SIGNAL TO NOISE RATIO; SUBSTRATES; ULTRAFAST PHENOMENA;

COPLANAR TRANSMISSION LINE; PHOTOCONDUCTIVE SWITCHES; TUNNELING CURRENTS; ULTRAFAST SCANNING TUNNELING MICROSCOPE (USTM);

SCANNING TUNNELING MICROSCOPY;

EID: 0029770268     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/eqec.1996.561873     Document Type: Conference Paper

References (3)