Comparison of proton implanted and selectively oxidized vertical-cavity surface-emitting lasers

Conference on Lasers and Electro-Optics Europe - Technical Digest

Volumn , Issue , 1996, Pages 165-

  Grabherr, M ^a   Weigl, B ^a   Reiner, G ^a   Ebeling, K J ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ION IMPLANTATION; OXIDATION; PERFORMANCE; PROTONS; REFRACTIVE INDEX; SEMICONDUCTOR DEVICE STRUCTURES; THERMAL CONDUCTIVITY;

CURRENT CONFINEMENT; OPTICAL GUIDING; PROTON IMPLANTATION; VERTICAL CAVITY SURFACE EMITTING LASER; WALLPLUG EFFICIENCY;

SEMICONDUCTOR LASERS;

EID: 0029770024     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/cleoe.1996.562258     Document Type: Conference Paper

References (1)