Random distribution of Ge and Si in synthetic talc: An EXAFS and FTIR study

European Journal of Mineralogy

Volumn 8, Issue 2, 1996, Pages 289-299

  Martin, François ^a,e   Ildefonse, Philippe ^b   Hazemann, Jean Louis ^c   Petit, Sabine ^a   Grauby, Olivier ^d   Decarreau, Alain ^a  

^a UNIVERSITÉ DE POITIERS   (France)

^b UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^d CAMPUS DE LUMINY   (France)

^e UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

EXAFS; FTIR; Order disorder; Random distribution; Si Ge solid solution; Talc

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; GERMANIUM; ORDER DISORDER TRANSITIONS; SI-GE ALLOYS; SILICON; SOLID SOLUTIONS; TALC; THALLIUM ALLOYS; THALLIUM METALLOGRAPHY;

EXAFS; FTIR; MEDIUM RANGE ORDER; RANDOM DISTRIBUTION; RANDOMLY DISTRIBUTED; SPECTROSCOPIC TECHNIQUE; STRUCTURAL INFORMATION; TETRAHEDRAL SHEETS;

GERMANIUM METALLOGRAPHY;

EXAFS; FTIR SPECTROSCOPY; GERMANIUM; ORDERING; SILICON; SOLID SOLUTION; TALC;

EID: 0029769784     PISSN: 09351221     EISSN: None     Source Type: Journal    
DOI: 10.1127/ejm/8/2/0289     Document Type: Article

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