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Volumn , Issue , 1996, Pages 172-175
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Thermoelectric characteristics of homologous compounds with layer structures in the ZnO-In2O3 system
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
COMPOSITION EFFECTS;
ELECTRIC CONDUCTIVITY MEASUREMENT;
METALLIC COMPOUNDS;
METALLOGRAPHIC MICROSTRUCTURE;
OXIDES;
SEMICONDUCTOR MATERIALS;
SINTERING;
THERMAL CONDUCTIVITY OF SOLIDS;
THERMAL VARIABLES MEASUREMENT;
THERMOELECTRICITY;
CARRIER MOBILITY;
LAYER STRUCTURES;
METALLIC OXIDES;
SEEBECK COEFFICIENTS;
SEMICONDUCTING OXIDE CERAMICS;
THERMOELECTRIC MATERIALS;
CERAMIC MATERIALS;
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EID: 0029768213
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (2)
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References (12)
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