Towards a microscopic interpretation of the dielectric function of porous silicon

Materials Research Society Symposium - Proceedings

Volumn 405, Issue , 1996, Pages 209-214

  Rossow, U ^a   Frotscher, U ^a   Aspnes, D E ^a   Richter, W ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; DIELECTRIC PROPERTIES OF SOLIDS; DIELECTRIC RELAXATION; ELECTRONIC PROPERTIES; ELLIPSOMETRY; ENERGY GAP; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; SEMICONDUCTOR DOPING;

DIELECTRIC FUNCTION; ENERGY SHIFT; INTERBAND CRITICAL POINTS;

POROUS SILICON;

EID: 0029766060     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)