Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2805, Issue , 1996, Pages 311-322

  Fitch, J J ^a   Graessle, Dale E ^a   Harris, Bernard ^a   Hughes, John P ^a   Nguyen, Dan T ^a   Schwartz, Daniel A ^a   Blake, Richard L ^a  

^a SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEBYE-WALLER ROUGHNESS CORRECTION FACTOR; FRESNEL EQUATIONS; IRIDIUM REFLECTANCE MEASUREMENT; WITNESS MIRRORS; X RAY ASTROPHYSICS FACILITY;

ALGORITHMS; ASTROPHYSICS; CALIBRATION; IRIDIUM; MATHEMATICAL MODELS; OPTICAL COATINGS; REFRACTIVE INDEX; TELESCOPES;

MIRRORS;

EID: 0029765983     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)