Complex impedance analysis of silica surface film on molybdenum disilicide

Materials Research Society Symposium - Proceedings

Volumn 411, Issue , 1996, Pages 223-228

  Lin, Wen yi ^a   Gerhardt, Rosario A ^a   Speyer, Robert F ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; DIELECTRIC RELAXATION; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC IMPEDANCE; MOLYBDENUM COMPOUNDS; PERMITTIVITY; SILICA; SPECTROSCOPIC ANALYSIS; THERMAL EFFECTS; THIN FILMS;

COMPLEX IMPEDANCE ANALYSIS; COMPLEX IMPEDANCE CURVES; IMPEDANCE SPECTROSCOPY; RELAXATION FREQUENCY; RELAXATION TIME; SILICA SURFACE FILMS;

PROTECTIVE COATINGS;

EID: 0029765897     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)