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Volumn 395, Issue , 1996, Pages 319-324
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Single crystal wurtzitic aluminum nitride growth on silicon using supersonic gas jets
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CRYSTAL GROWTH;
CRYSTAL ORIENTATION;
CRYSTAL STRUCTURE;
JETS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING SILICON;
SINGLE CRYSTALS;
SUBSTRATES;
SUPERSONIC FLOW;
X RAY CRYSTALLOGRAPHY;
FULL WIDTH HALF MAXIMA;
KINETIC ENERGY;
PRECURSORS;
SEEDING;
SUPERSONIC GAS JETS;
SURFACE ANALYSIS;
TRIETHYLALUMINUM;
WURTZITIC ALUMINUM NITRIDE;
X RAY ROCKING CURVE;
SEMICONDUCTING ALUMINUM COMPOUNDS;
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EID: 0029763865
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (8)
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