Epitaxial growth of α-Fe films on CaF2(111)/Si(111) structures

Thin Solid Films

Volumn 272, Issue 1, 1996, Pages 83-86

  Mattoso, N ^a   Mosca, D H ^a   Schreiner, W H ^a   Mazzaro, I ^a   Teixeira, S R ^b  

^a FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^b FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

Epitaxy; Growth mechanism; Iron; X ray diffraction

Indexed keywords

CALCIUM COMPOUNDS; CHARACTERIZATION; CRYSTAL ORIENTATION; DEPOSITION; EPITAXIAL GROWTH; EVAPORATION; IRON; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; X RAY DIFFRACTION;

BUFFER LAYERS; CALCIUM FLUORIDE; GRAZING ANGLE X RAY DIFFRACTION; GROWTH MECHANISM; ROCKING CURVE CRYSTAL QUALITY ANALYSIS;

METALLIC FILMS;

EID: 0029762561     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06977-1     Document Type: Article

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