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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2666, Issue , 1996, Pages 223-232

  Heckman, Tom ^a   Krumm, John C ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTOURS; EDGE FINDING; IMAGE SEGMENTATION; IONIOZING RADIATION;

ALGORITHMS; IMAGE PROCESSING; IONIZATION; MEDICAL APPLICATIONS; SPECKLE; TISSUE;

ULTRASONIC IMAGING;

EID: 0029757896     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)