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Volumn 37, Issue 1, 1996, Pages 63-66

In-situ SEM observation of microstructural evolution of high purity aluminum deformed at elevated temperatures

Author keywords

Aluminum; Creep; In situ subgrain evolution; Microstructure; Scanning electron microscopy

Indexed keywords

COOLING; CREEP; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; DEFORMATION; GRAIN BOUNDARIES; HIGH TEMPERATURE EFFECTS; METALLOGRAPHIC MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; STRESSES; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0029757819     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.37.63     Document Type: Article
Times cited : (6)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.