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Volumn 37, Issue 1, 1996, Pages 63-66
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In-situ SEM observation of microstructural evolution of high purity aluminum deformed at elevated temperatures
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Author keywords
Aluminum; Creep; In situ subgrain evolution; Microstructure; Scanning electron microscopy
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Indexed keywords
COOLING;
CREEP;
CRYSTAL ORIENTATION;
CRYSTALLOGRAPHY;
DEFORMATION;
GRAIN BOUNDARIES;
HIGH TEMPERATURE EFFECTS;
METALLOGRAPHIC MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
STRESSES;
SURFACE STRUCTURE;
TRANSMISSION ELECTRON MICROSCOPY;
CRYSTALLOGRAPHIC CONTRAST TECHNIQUE;
HIGH PURITY ALUMINUM;
HIGH TEMPERATURE DEFORMATION;
MICROSTRUCTURAL EVOLUTION;
ALUMINUM;
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EID: 0029757819
PISSN: 09161821
EISSN: None
Source Type: Journal
DOI: 10.2320/matertrans1989.37.63 Document Type: Article |
Times cited : (6)
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References (14)
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