Double modulation and selective excitation photoreflectance for characterizing highly luminescent semiconductor structures and samples with poor surface morphology

Materials Research Society Symposium - Proceedings

Volumn 406, Issue , 1996, Pages 229-240

  Amirtharaj, P M ^a   Chandler Horowitz, D ^a   Bour, D P ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); FREQUENCY MODULATION; LUMINESCENCE; MICROSTRUCTURE; MORPHOLOGY; REFLECTOMETERS; SCATTERING; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR LASERS;

DOUBLE MODULATION; ELECTROMODULATED REFLECTIVITY SPECTROSCOPY; PHOTOREFLECTANCE SPECTROSCOPY; PUMP BEAMS; PUMP WAVELENGTH;

SPECTROSCOPIC ANALYSIS;

EID: 0029757244     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)