On the use of LEIS to determine concentration depth profiles in binary alloys: Application to PtNi(111)

Surface and Interface Analysis

Volumn 24, Issue 1, 1996, Pages 34-37

  Bertolini, J C ^a   Delichere P ^a   Hermann, P ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; HELIUM; IONS; LOW ENERGY ELECTRON DIFFRACTION; MATHEMATICAL MODELS; PLATINUM ALLOYS; SCATTERING; SINGLE CRYSTALS; SPUTTERING; SURFACE PROPERTIES; SURFACES;

CONCENTRATION DEPTH PROFILE; LOW ENERGY ION SCATTERING; PLATINUM NICKEL ALLOYS;

BINARY ALLOYS;

EID: 0029757054     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199601)24:1<34::AID-SIA80>3.0.CO;2-X     Document Type: Article

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