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Volumn 409, Issue , 1996, Pages 155-161
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Simulation of thermal stresses, voids and fracture at the GaAs/ceramic interface
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC MICROSCOPES;
ALUMINA;
CERAMIC MATERIALS;
COMPUTER SIMULATION;
CRACK PROPAGATION;
DIES;
FINITE ELEMENT METHOD;
FRACTURE;
SEMICONDUCTING GALLIUM ARSENIDE;
TEMPERATURE;
THERMAL CYCLING;
THERMAL STRESS;
COMPUTER AIDED THERMOMECHANICAL MODELLING;
DIE CRACKING;
DIE STRESSES;
POWER CYCLING;
TEMPERATURE CYCLING;
THERMAL MANAGEMENT;
VOIDS;
INTERFACES (MATERIALS);
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EID: 0029756987
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (4)
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