Structural control of epitaxially grown sputtered perovskite thin films

Materials Research Society Symposium - Proceedings

Volumn 401, Issue , 1996, Pages 151-161

  Wasa, Kiyotaka ^a   Sato, Toshifumi ^a   Adachi, Hideaki ^a   Setsune, Kentaro ^a   Trolier McKinstry, S ^a   Schlom, Darrell G ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; CRYSTAL ORIENTATION; ELECTRON MICROSCOPY; ELLIPSOMETRY; EPITAXIAL GROWTH; LEAD COMPOUNDS; MICROSTRUCTURE; PEROVSKITE; SINGLE CRYSTALS; SPUTTERING; X RAY CRYSTALLOGRAPHY;

ADATOMS; LEAD TITANATE; MISCUT SUBSTRATE; SPECTROSCOPIC ELLIPSOMETRY; STRONTIUM TITANATE;

THIN FILMS;

EID: 0029756669     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)