Influence of ohmic contacts on semi-insulating GaAs detector performances

Materials Research Society Symposium - Proceedings

Volumn 406, Issue , 1996, Pages 431-436

  Castaldini, A ^a   Cavallini, A ^a   Canali, C ^a   Chiossi, C ^a   del Papa, C ^a   Nava, F ^a   Lanzieri, C ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEFECTS; ELECTRIC FIELDS; IMAGING TECHNIQUES; PARTICLE DETECTORS; PERFORMANCE; SEMICONDUCTING GALLIUM ARSENIDE; SPECTROSCOPIC ANALYSIS;

CHARGE COLLECTION SCANNING MICROSCOPY; LIQUID ENCAPSULATED CZOCHRALSKI; PHOTO INDUCED CURRENT TRANSIENT SPECTROSCOPY; TRAP DENSITY;

OHMIC CONTACTS;

EID: 0029756573     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)