RAM testing algorithms for detection multiple linked faults

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 435-439

  Mikitjuk, V G ^a   Yarmolik, V N ^a   van de Goor, A J ^a  

^a BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FAILURE ANALYSIS; MATHEMATICAL MODELS;

INDUCTIVE FAULT ANALYSIS; MARCH TESTS; MULTIPLE LINKED FAULTS;

RANDOM ACCESS STORAGE;

EID: 0029756562     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)