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Volumn 33, Issue 1, 1996, Pages 65-69
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Technology 1996: test & measurement
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATIC TESTING;
COMPUTER SOFTWARE;
INTEGRATED CIRCUIT TESTING;
INTEGRATED CIRCUITS;
PRINTED CIRCUIT BOARDS;
SILICON WAFERS;
STANDARDS;
BUILT IN SELF TEST;
DESIGN FOR TESTABILITY;
SOFTWARE TESTING;
TEST AND MEASUREMENT;
SEMICONDUCTOR DEVICES;
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EID: 0029756428
PISSN: 00189235
EISSN: None
Source Type: Journal
DOI: 10.1109/6.476734 Document Type: Article |
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Times cited : (1)
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References (0)
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