Determination of the propagation constant of coupled lines on chips based on high frequency measurements

Proceedings of the IEEE Multi-Chip Module Conference

Volumn , Issue , 1996, Pages 99-104

  Winkel, Thomas Michael ^a   Sagar Dutta, Lohit ^a   Grabinski, Hartmut ^a   Grotelueschen, Enno ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC LOSSES; ELECTRIC NETWORK PARAMETERS; ELECTRIC VARIABLES MEASUREMENT; ELECTROMAGNETIC WAVE PROPAGATION; ELECTROMAGNETIC WAVE SCATTERING; FABRICATION; FREQUENCY RESPONSE; SILICON WAFERS; SUBSTRATES;

COUPLED LINES; MATHEMATICAL DERIVATION; PROPAGATION CONSTANT;

INTEGRATED CIRCUITS;

EID: 0029756326     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)