Obstacle detection by recognizing binary expansion patterns

IEEE Transactions on Aerospace and Electronic Systems

Volumn 32, Issue 1, 1996, Pages 191-198

  Baram, Yoram ^a   Barniv, Yair ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b NASA AMES RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLLISION AVOIDANCE; COMPUTER VISION; FEATURE EXTRACTION; IMAGE SENSORS; LEARNING SYSTEMS; OPTICAL FLOWS;

BINARY EXPANSION PATTERNS; IMAGE INTENSITY; IMAGE PLANE PROJECTION; NEURAL LEARNING TECHNIQUES; OBSTACLE DETECTION;

PATTERN RECOGNITION;

EID: 0029756291     PISSN: 00189251     EISSN: None     Source Type: Journal    
DOI: 10.1109/7.481261     Document Type: Article

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