Deterministic pattern generation for weighted random pattern testing

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 30-36

  Reeb, Birgit ^a   Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; RANDOM PROCESSES;

BUILT IN SELF TEST (BIST) SCHEME; DETERMINISTIC PATTERN GENERATION; WEIGHTED RANDOM PATTERN TESTING;

LOGIC CIRCUITS;

EID: 0029755980     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (29)