Detection of electric-field-ionized Rydberg atoms originating from laser ablation of Si

Journal of Applied Physics

Volumn 79, Issue 1, 1996, Pages 467-471

  Van Ingen, R P ^a,b,c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b TNO   (Netherlands)

^c PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRIC FIELDS; ELECTRONS; IONIZATION; IONS; LASER ABLATION; LASER PRODUCED PLASMAS; MASS SPECTROMETERS; PHOTONS; SILICON;

ANGLE RESOLVED TIME OF FLIGHT SPECTROMETRY; ANGLE RESOLVED YIELD DISTRIBUTION; KINETIC ENERGY; QUADRUPOLE MASS SPECTROMETERS; RYDBERG ATOMS;

ATOMS;

EID: 0029755503     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361043     Document Type: Article

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