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Volumn 79, Issue 2, 1996, Pages 1099-1108

Pulsed laser sputtering of the (100)GaAlAs surface

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; IONS; MASS SPECTROMETRY; MATHEMATICAL MODELS; MICROANALYSIS; PHOTOIONIZATION; PHOTONS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; SPUTTERING; SURFACE TREATMENT; X RAY SPECTROSCOPY;

EID: 0029755422     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360908     Document Type: Article
Times cited : (7)

References (23)
  • 5
    • 84975629935 scopus 로고
    • edited by A. Benninghoven, C. A. Evans, A. M. Huber, K. McKeegan, H. A. Stroms, and H. W. Werner Wiley, New York
    • S. W. Downey and R. S. Hozak, in Secondary Ion Mass Spectrometry, SIMS VII, edited by A. Benninghoven, C. A. Evans, A. M. Huber, K. McKeegan, H. A. Stroms, and H. W. Werner (Wiley, New York, 1990). p. 283.
    • (1990) Secondary Ion Mass Spectrometry, SIMS VII , pp. 283
    • Downey, S.W.1    Hozak, R.S.2
  • 8
    • 36549096046 scopus 로고
    • R. Kelly and R. W. Dreyfus, Nucl. Instrum. Methods B 32, 341 (1988): R. Kelly. J. Chem. Phys. 92, 5047 (1990); Phys. Rev. A 46. 860 (1992).
    • (1990) J. Chem. Phys. , vol.92 , pp. 5047
    • Kelly, R.1
  • 9
    • 0001379478 scopus 로고
    • R. Kelly and R. W. Dreyfus, Nucl. Instrum. Methods B 32, 341 (1988): R. Kelly. J. Chem. Phys. 92, 5047 (1990); Phys. Rev. A 46. 860 (1992).
    • (1992) Phys. Rev. A , vol.46 , pp. 860


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.