Electrostatic modeling and ESD damage of magnetoresistive sensors

IEEE Transactions on Magnetics

Volumn 32, Issue 1, 1996, Pages 49-53

  Wallash, Albert J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS; MAGNETIC HEADS; MAGNETIC RECORDING; MAGNETORESISTANCE; MAXWELL EQUATIONS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; THIN FILM DEVICES;

ELECTROSTATIC DISCHARGE (ESD); MAGNETORESISTIVE SENSORS;

SENSORS;

EID: 0029755190     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.477549     Document Type: Article

References (9)

1. H.Tian and J.K. Lee, "Electrostatic Discharge Damage of MR Heads", INTERMAG 1995.
2. Schaffert R.M, ELECTROPHOTOGRAPHY, 1966, p.321.
3. McAteer, O.J, ELECTROSTATIC DISCHARGE, CONTROL, 1990, p.169.
4. Greason, W.D., ELECTROSTATIC DISCHARGE IN ELECTRONICS, John Wiley and Sons, 1992, p.150.
5. MICROSIM Corp., Irvine, CA.
6. J.Smith, "Electrical Overstress Failure Analysis in Microcircuits", Proc. IEEE Rel. Phys. Symp., 1978, pp. 41-6.
7. ANSOFF Corp., Pittsburgh, PA.
8. A. Wallash and T. Hughbanks, "Capacitive Coupling Effects in Spark Gap Devices", 1994 EOS/ESD Symp. Proc., pp.273-8.
9. Greason, W.D., ELECTROSTATIC DISCHARGE IN ELECTRONICS, J. Wiley & Sons, Inc., 1992, p.47, pp. 120-29.