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Volumn 416, Issue , 1996, Pages 407-418

Diamond sensors and vacuum microelectronics

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; IONIZATION; LEAKAGE CURRENTS; MICROELECTRONICS; NEUTRONS; RADIATION; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE TESTING; SENSORS; TRANSPORT PROPERTIES;

EID: 0029754896     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (59)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.