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Volumn , Issue , 1996, Pages 228-233
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By an improved drying method
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DRYING;
ELECTRODES;
ETCHING;
ETHERS;
FABRICATION;
INTERFEROMETERS;
SEMICONDUCTING GLASS;
SEMICONDUCTING SILICON;
SILICON WAFERS;
SURFACE TENSION;
THIN FILMS;
ANODIC BONDING;
ELECTROSTATIC FORCE;
FLUORINERT;
LASER ASSISTED ETCHING METHOD;
SILICON THIN BEAM STRUCTURE;
SENSORS;
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EID: 0029754594
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (14)
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References (14)
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