Imaging of silicon carrier dynamics with near-field scanning optical microscopy

Materials Research Society Symposium - Proceedings

Volumn 406, Issue , 1996, Pages 189-194

  La Rosa, A H ^a   Yakobson, B I ^a   Hallen, H D ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPUTER SIMULATION; CRYSTAL DEFECTS; DIFFUSION; INFRARED TRANSMISSION; SEMICONDUCTING SILICON; SILICON ON INSULATOR TECHNOLOGY; SURFACE STRUCTURE;

CARRIER LIFETIME; FREE CARRIERS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SURFACE TOPOGRAPHY;

OPTICAL MICROSCOPY;

EID: 0029754196     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)