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Thin Solid Films

Volumn 272, Issue 1, 1996, Pages 49-51

Scanning tunneling microscopy study of antiphase boundaries on the (001) surface of homoepitaxial diamond films

(6) Kuang, Yalei a Badzian, Andrzej a Tsong, Tien T b Lee, Naesung a Badzian, Teresa a Chen, Chonglin c

a PENNSYLVANIA STATE UNIVERSITY (United States)

b INSTITUTE OF PHYSICS (Taiwan)

c LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

Boron; Diamond; Epitaxy; Scanning tunnelling microscopy

Indexed keywords

BORON; CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; DOPING (ADDITIVES); LATTICE CONSTANTS; MORPHOLOGY; PLASMA APPLICATIONS; PYROMETERS; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACE STRUCTURE; SURFACES;

ANTIPHASE BOUNDARIES; ATOMIC IMAGES; DIMER; SINGLE STEP EDGES;

DIAMOND FILMS;

EID: 0029754041 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/0040-6090(95)06966-6 Document Type: Article

Times cited : (3)

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