Oxide superconductor interfaces studied by spectroscopic ellipsometry

Materials Research Society Symposium - Proceedings

Volumn 401, Issue , 1996, Pages 333-338

  Gibbons, B J ^a   Trolier McKinstry, S ^a   Schlom, D G ^a   Eom, C B ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; CHARACTERIZATION; CHEMISTRY; ELLIPSOMETRY; EPITAXIAL GROWTH; MICROSTRUCTURE; OXIDE SUPERCONDUCTORS; STRONTIUM COMPOUNDS; SUBSTRATES; THERMAL EFFECTS;

DIELECTRIC FUNCTION; INTERFACIAL REACTION LAYER; MODELED THICKNESS; NONDESTRUCTIVE CHARACTERIZATION TOOL; OXIDE SUPERCONDUCTOR INTERFACES; OXYGEN DEFICIENCIES; SPECTROSCOPIC ELLIPSOMETRY; YTTRIUM BARIUM CUPRATE;

INTERFACES (MATERIALS);

EID: 0029753045     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)