Microstructures and dielectric properties of ferroelectric glass-ceramics

Journal of the American Ceramic Society

Volumn 79, Issue 1, 1996, Pages 17-26

  Reece, Michael J ^a,e   Worrell, Clive A ^b,e   Hill, Graham J ^c,e   Morrell, Roger ^d,e  

^a AMERICAN CERAMIC SOCIETY   (United States)

^b UNIVERSITY OF SUSSEX   (United Kingdom)

^c ERA TECHNOLOGY LTD   (United Kingdom)

^d NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^e QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; FERROELECTRIC MATERIALS; GLASS; LEAD COMPOUNDS; PERMITTIVITY MEASUREMENT; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SOLID SOLUTIONS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DEVITRIFICATION; FERROELECTRIC GLASS CERAMICS;

CERAMIC MATERIALS;

EID: 0029752686     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb07875.x     Document Type: Article

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