|
Volumn 232, Issue 1-2, 1996, Pages 32-35
|
Electrical properties and chemical composition of VCr2S4
|
Author keywords
Electrical properties; VCr2Sx
|
Indexed keywords
ACTIVATION ENERGY;
COMPOSITION;
ELECTRIC CONDUCTIVITY MEASUREMENT;
ELECTRIC PROPERTIES;
HIGH PRESSURE EFFECTS;
POINT DEFECTS;
SEMICONDUCTOR MATERIALS;
STOICHIOMETRY;
SULFUR;
SYNTHESIS (CHEMICAL);
TEMPERATURE;
CONSTANT CONCENTRATION OF DEFECTS;
PERMUTATION;
VANADIUM CHROMIUM SULFIDE;
VANADIUM COMPOUNDS;
|
EID: 0029751457
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/0925-8388(95)01986-3 Document Type: Article |
Times cited : (6)
|
References (12)
|