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Volumn 31, Issue 6, 1996, Pages 783-788
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X-ray topographic assessment of defects in pure and substituted hexaferrite crystals
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION;
CRYSTAL DEFECTS;
CRYSTAL GROWTH;
CRYSTAL ORIENTATION;
CRYSTAL STRUCTURE;
DISLOCATIONS (CRYSTALS);
ETCHING;
FRACTOGRAPHY;
REFLECTION;
STRAIN;
X RAY CRYSTALLOGRAPHY;
DIFFRACTION TOPOGRAPHS;
HEXAFERRITE CRYSTALS;
MISORIENTED GRAINS;
TRANSMISSION SCANNING GEOMETRY;
X RAY TOPOGRAPHY;
STRONTIUM COMPOUNDS;
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EID: 0029748218
PISSN: 02321300
EISSN: None
Source Type: Journal
DOI: 10.1002/crat.2170310613 Document Type: Article |
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Times cited : (2)
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References (8)
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