Life tests and failure analysis of AlGaN/InGaN/GaN blue light-emitting diodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2693, Issue , 1996, Pages 64-72

  Barton, Daniel L ^a   Osinski, Marek ^a   Helms, Christopher J ^a   Berg, Niel H ^a   Phillips, B Scott ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLOR; FAILURE ANALYSIS; SEMICONDUCTING GALLIUM COMPOUNDS; SERVICE LIFE; TESTING;

GALLIUM NITRIDE; I-V CHARACTERISTICS; WIDE-BAND-GAP STRUCTURES;

LIGHT EMITTING DIODES;

EID: 0029748037     PISSN: None     EISSN: None     Source Type: None    
DOI: 10.1117/12.239012     Document Type: Conference Paper

References (19)