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Volumn 2809, Issue , 1996, Pages 45-56
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Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals
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Author keywords
[No Author keywords available]
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Indexed keywords
CADMIUM ZINC TELLURIDE;
NONWETTING CRYSTAL GROWTH;
STRUCTURAL DEFECTS;
SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY;
CHARACTERIZATION;
CRYSTAL DEFECTS;
CRYSTAL GROWTH;
DEFECTS;
GRAVITATIONAL EFFECTS;
MICROGRAVITY PROCESSING;
OPTIMIZATION;
SOLIDIFICATION;
SEMICONDUCTING CADMIUM COMPOUNDS;
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EID: 0029747979
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (13)
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