Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2775, Issue , 1996, Pages 297-304

  Gliech, Stefan ^a   Duparre, Angela ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COBLENTZ SPHERE;

INFRARED RADIATION; LIGHT SOURCES; MICROMETERS; OPTICAL SYSTEMS; ROUGHNESS MEASUREMENT; ULTRAVIOLET RADIATION;

LIGHT SCATTERING;

EID: 0029746570     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)