Measurement of Young's modulus and Poisson's ratio of free-standing Ag/Cu multilayered thin films

Materials Research Society Symposium - Proceedings

Volumn 405, Issue , 1996, Pages 501-505

  Huang, Haibo ^a   Spaepen, Frans ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELASTIC MODULI; ELECTROMAGNETIC WAVE DIFFRACTION; LASER APPLICATIONS; MULTILAYERS; SILVER; STRAIN MEASUREMENT; TENSILE TESTING;

LASER DIFFRACTION; POISSON RATIO; SUPERMODULUS EFFECT;

THIN FILMS;

EID: 0029745869     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)